About the Authors

• Author: Bradford P. Lyerla
• Pages: ix-x

ix

About the Authors

Bradford P. Lyerla, Editor-in-Chief, co-chair of Jenner & Block’s Pat-

ent Litigation and Counselling Practice, is a nationally recognized trial

lawyer who focuses on patent and trade secret litigation. Recognized as

a leader in his field by numerous organizations, he is highly regarded by

peers and clients alike for his trial skills, litigation wisdom, and strategic

thinking. He has tried dozens of high-stakes trials and argued numerous

appeals representing a who’s who of prominent corporations involved in

technologies ranging from pharmaceuticals and medical devices to food

and chemical manufacturing to communications and computing.

Edward M. Roney, Managing Editor, is an attorney with Coats and

Bennett PLLC. His practice is focused in the areas of patent litigation

and post-grant reviews, trade secret and unfair competition litigation, and

intellectual property licensing. He represents a diverse range of clients

from emerging growth to Fortune 500 companies across many industries

and technologies. He has negotiated and drafted numerous technology

and software licenses and has represented leading consumer electronics

companies with the patenting of their technology. Mr. Roney is a former

technology executive, having co-founded a fabless semiconductor manufac-

turer, which provided highly integrated chipsets, software, and licensed

intellectual property to the world’s top cellular handset manufacturers.

Further, Inc. magazine recognized him for having one of the fastest-

growing companies in the United States, and the Wall Street Journal hon-

ored him for his leadership in wireless communications.

David L. Newman is a partner and chair of the Intellectual Property

Group at Gould & Ratner, LLP. Mr. Newman focuses his practice on intel-

lectual property law, including patents, trademarks, copyrights, and trade

secrets. His experience includes handling litigation involving intellectual

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